|
Catalogs
Certificates
Newsletters
Contact Us
Links
Feedback
|
|
ILAP '10 - ILAP '09 - ILAP '08 - ILAP '07
ILAP '06 - ILAP '05 - ILAP '04 - ILAP '03
The ILAP '11 Conference was held Aug. 07-09, 2011 at the DoubleTree Hotel Durango, CO.
ILAP '11 Presentations
ILAP Status and Accomplishments in 2010 / 2011
- Dan Geist, Analytical Reference Materials International NIST SRM Status update
- John Sieber, NIST - Analytical Chemistry Div. Brammer Stds. CRM/RM Status update
- Bob Brammer, Brammer Standards Alcoa CRM/RM Status update
- Keith Trischan, Alcoa Technical Center LGC Standards - the Distributor
- Roger Kasselstrand, LGC Standards GmbH ASTM E01 Status Update
- Pat Cole, Allvac, Monroe (ASTM E01) Auditing Directions, Present and Future
- Randy Kunish, PRI Auditor (NADCAP) Auditing Directions, Present and Future
- Fran Azzarto, GE/SNECMA Auditing Directions, Present and Future
- Bob Brammer, Brammer Standards ARMIs Approach to Third Party Proficiency Testing
- Sheryl Lucas, Analytical Reference Materials International ARMI and the ISO 31-34 Guides
- Dan Geist, Analytical Reference Materials International Laboratory Testing, Inc. - Since 1984
- Lee Dilks, Laboratory Testing, Inc. Updating the Glass Concentric Nebulizer
- Geoff Coleman, MEINHARD - Elemental Scientific Glassblowing Light Element Analysis with Handheld XRF
- Bree Allen, Olympus Innov-X Latest Developments in Handheld and Portable XRF
- Debbie Schatzlein, ThermoFisher Niton Metals analysis using PMT based Arc-Spark Spectrometers
- Randy Moffat, Angstrom Risk Management: ISO 31000
- Mike Porfilio, Anderson Laboratories DC-Arc Update, Compilation of Available Application Reports
- Paul Dalager, Analytical Reference Materials International Recommendations for new CRMs, and Where & When for ILAP ’12
- Dan Geist, Analytical Reference Materials International
The ILAP '10 Conference was held Jul. 28-30, 2010 at The Magnolia Hotel in Denver, CO.
ILAP '10 Presentations
ILAP Status and Accomplishments in 2009 / 2010 NIST standards development report MBH standards development report, and standards development capabilities LGC (Breitlander) standards development report, and surface prparation capabilities NIST Certs and the ISO 31-34 guides Measurement Uncertainty and Analytical Decision in AES Spectrometry Modern ICP-MS, New Directions and Capabilities Latest Developments in Handheld XRF (Non Niton) Working Together - Maximizing the Value of the Laboratory Accreditation Process WEEE, RoHS - Current Trends in Substance Regulations, New Laws and Standards Activities SCLA Steel Calibration Standards Set, Re-issue of IARM 164A-173A, 180A, &181A Recommendations for new CRMs, and Where & When for ILAP ’11 Closing Remarks, Company Status, & Future Vision
The ILAP '09 Conference was held Jul. 23-24, 2009 at Vail Plaza Hotel in Vail, CO.
ILAP '09 Presentations
ILAP Status and Accomplishments in 2008 / 2009
- Daniel Geist, Analytical Reference Materials International ICP-AES: Statistics Simplified
- Dr. Geoff Coleman, Meinhard Glass Products Modern ICP-AES
- Dr. Geoff Coleman, Meinhard Glass Products SCLA Steel Calibration Standards Set, Re-issue of IARMs 164A-173A
- Daniel Geist, Analytical Reference Materials International Latest Developments in Handheld XRF
- Jim Pasmore, Thermo Scientific - Niton Analyzers GD-AES: Practical Experiences in a Commercial Laboratory
- Greg Mann, Mike Porfilio, Anderson Laboratories, Inc. Feasibility of C/S Calibration Standards, What, and How Many?
- Daniel Geist, Analytical Reference Materials International LA ICP-MS Methods: Beginnings, Evolution, & Current Status
- Alan Koenig, USGS Mineral Resources Team What's registrations are required of a CRM producer
- Daniel Geist, Analytical Reference Materials International ICP-AES, DCP-AES, & DCA-AES Techniques: Strength and Weaknesses
- Dr. Geoff Coleman, Meinhard Glass Products DCA-AES: Status and Preliminary Capabilities
- Paul Dalager, Analytical Reference Materials International Recommendations for new CRMs, and Where & When for ILAP 10
- Daniel Geist, Analytical Reference Materials International Closing Remarks, Company Status, & Future Vision
- Bill Britt, Analytical Reference Materials International
The ILAP '08 Conference was held Oct. 08-10, 2008 at The Vail Marriot Spa & Resort in Vail Colorado. The meeting was extremely well attended.
ILAP '08 Presentations
ILAP Status and Accomplishments in 2007/2008
- Daniel Geist, Analytical Reference Materials International NIST Standards Development Report, & NISTs Free-Cutting Brass (SRM 1124) Project
- John Sieber, NIST New Reference Materials for Refined / Electrowon Copper
- John Sieber, NIST A Summary of Laser Ablation ICP-MS Methods: The Good, the Bad and the Ugly
- Alan Koenig, USGS Mineral Resources Team REACH - What is It and Why Should I Care?
- Gary Beck, ATI Wah Chang Applications of ICPMS in a Production Laboratory
- Fergus Keenan, Thermo Fisher Scientific Measurement Uncertainty and Analytical Decision in AES Spectrometry
- Edmund Halsz, Thermo Fisher Scientific Maximizing the Value of the Laboratory Accreditation Process
- Randy Kunish GDAES: Method, Calibration & Performance for Bulk and Quant. Depth Profile Analysis
- Charlie Maul, LECO Corporation Trace Element Analysis of High-Purity Nickel Using a New DCA-AES Echelle Spectrometer
- Garry Kunselman, Teledyne Instruments Leeman Labs Haynes Capabilities for Production of Calibration Standards for Nickel & Cobalt Alloys
- Anil Joshi, Haynes International Latest Advancements in Metal Analysis
- Wayne Vereb, Spectro Analytical Instruments, Inc. The Advantages and Benefits of SDD for Handheld XRF Analyzers
- Charles Johnson, Thermo Fisher Scientific (Niton Analyzers)
The ILAP '07 Conference was held July 25-27, 2007 at The Great Divide Lodge in Breckenridge Colorado. The meeting was extremely well attended.
ILAP '07 Presentations
ILAP Status and Accomplishments in 2006/2007
- Daniel Geist, Analytical Reference Materials International LA-ICPMS: New (and Old) Directions and Possibilities for Challenging Samples
- Alan Koenig, USGS - Mineral Resources Team Improved Performance and Productivity for ICP Analysis by an Innovative Optical Design
- Dion Tsourides, Spectro AI, Inc. Current State of PT activities and CRM system in Chinese Metallurgical Industry
- Wang Haizhou, China NIL Research Center for PT Generations & Transformations, a Glimpse of What's New
- Jim Pasmore, Thermo Scientific - Niton Analyzers Working Together - Maximizing the Value of the Laboratory Accreditation Process
- Dave Luoni, Performance Review Institute An impending development regarding ANSI and ISO REMCO
- Bob Watters, NIST - Measurement Services ASTM E01 - Analytical Chemistry for Metals, PT Programs and ILS Programs
- Tom OToole, ASTM International ASTM E01 - A Cooperative Partnership for Analytical Method Development
- Carroll Davis, Alcoa Sample Preparation - Part of Your Spectrometer Performance
- Rolf Breitlander, Breitlander GmbH Can small really be as good as big?
- Debbie Schatzlein, Thermo Scientific - Niton Analyzers OPA-Novel Statistic Characterization of Chemical Compositions and its States in Metals
- Wang Haizhou, China NIL Research Center for PT Dilution by Weight - Improved Accuracies and Cost Efficiencies for Digestions
- Alexis Puerta, IMR Test Labs Ni Base Single Crystal Super-Alloys
- Wayne Brege, C-M Group HR-Glow Discharge MS: An Overview on How and Where it is Applied
- Richard Balamut, EAG LLC, SHIVA Technologies
The ILAP '06 Conference was held August 7-11, 2006 at The Winter Park Mountain Lodge in Winter Park, CO. The meeting was extremely well attended.
ILAP '06 Presentations
ILAP Status and Accomplishments in 2005/2006
- Daniel Geist, ARMI Laser Ablation ICP-MS, New (and Old) Directions and Capabilities for Challenging Samples
- Alan Koenig, USGS Matrix-Independent Analysis of Minor Alloying Elements in Nickel
- Anil Joshi, Haynes International, Inc. The Changing Face of Portable XRF
- Jim Pasmore, NITON Analyzers Current Trends in Substance Regulations, New Laws and Standards Activities
- Timothy McGrady, Serious Science Applications of ICPMS in a Production Laboratory
- Ruth Wolf, USGS A Statistical Approach to Solution Standards Management
- Juris Sarins, Sipi Metals Corp. Advanced Capabilities of the Shimadzu PDA-7000 AES
- Ken Suddaby, Canalytical EDXRD - New Technology
- Carl Cork, Compass Engineering
The ILAP '05 Conference was held July 27 - 29, 2005 at The Double Hotel & Conference Center at Cripple Creek, CO. The meeting was extremely well attended.
ILAP '05 Presentations
ILAP program status and accomplishments in 2004/2005
- Daniel Geist, ARMI ICP-MS analysis and where it fits in the Analytical Lab
- Alan Koenig, USGS Glow Discharge MS, an Affordable Technique for the Lab
- Meike Hamester, Thermo Electron Laser Ablation ICP-MS an Evolving Technique for the Metals Lab
- Alan Koenig, USGS Latest Advancements in Portable X-Ray Technology
- Jim Pasmore, Niton One Hundred & Fourteen Years of Gold Mining
- David Vardiman, CC & Victor Mining Co EU Directives & ASTM F40 on Declarable Substances in Materials
- Tim McGrady, IMR Testing Heavy Elements in Plastic, Multi-Element Reference Samples
- Stan Piorek, MAT LLC Lab Accreditation, Present, and Future Scopes
- David Luoni, Performance Review Institute Testing tips for Bi in Lead-Free Alloys
- Juris Sarins, Sipi Metals & Lee Dilks, Lab Testing Matrix-independent analysis of minor alloying elements
- Dave McAnallen, Huntington Alloys Tour of the Victor Mine
- David Vardiman, CC & Victor Mining Co
The ILAP '04 Conference was held July 28 - 30, 2004 at The Steamboat Grand Hotel at Steamboat, CO.
ILAP '04 Presentations
ILAP program status and accomplishments in 2003/2004 - Daniel Geist, ARMI Small lot production capabilities for CRM's - Rick Corn, David McAnallen, Huntington Alloys GDS applications & where they fit in the analytical loop - Charlie Maul, LECO Automatic Fusion Instrumentation - Rolf Breitlander, Breitlander GmbH Cobalt futures, Rene 125, 8h, Stellite 21 - Wayne Brege, Cannon Muskegon Recent Developments in Miniaturized Portable XRF Technology - Jim Pasmore, NITON NIST SRM Status Report - John Sieber, NIST Sustainable Development - Tim McGrady, IMR Test Labs Cast Iron PM Spectrometer Standards - Tony Thoma, Wescast Ind. & Paul Dalager, ARMI A Traceability Tool - John Sieber, NIST Traceability, Validation, & Uncertainty in Quantitative XRF - John Sieber, NIST What's all the fuss about MicroNebulizers? - Geoff Coleman, MGP Chemical Analysis Methods for P/M Products - Tim McGrady, IMR Test Labs Comments about ASTM E01 @ NIST - John Sieber, NIST & Dan Geist, ARMI Testing Tips for Lead-Free Alloys & CRM Status - Juris Sarins, SIPI Metals Critique of ARMI's process of value assignment- Tim Benner, Carpenter Technologies
The ILAP '03 Conference was held July 30 - August 2, 2003 at The Charter at Beaver Creek, CO.
ILAP '03 Presentations
|
|